Etzelstorfer, Tanja and Wyss, Andreas and Süess, Martin J and Schlich, Franziska F and Geiger, Richard and Frigerio, Jacopo and Stangl, Julian (2017) Determining the directional strain shift coefficients for tensile Ge: a combined x-ray diffraction and Raman spectroscopy study. Measurement Science and Technology, 28 (2). 025501. ISSN 0957-0233
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Abstract
In this work the calibration of the directional Raman strain shift coefficient for tensile strained Ge microstructures is reported. The strain shift coefficient is retrieved from micro-Raman spectroscopy measurements in combination with absolute strain measurements from x-ray diffraction using focused synchrotron radiation. The results are used to fit the phonon deformation potentials. A linear dependence of the phonon deformation potentials p and q is revealed. The method can be extended to provide strain calibration of Raman experiments also in other material system.
Item Type: | Article |
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Subjects: | AP Academic Press > Computer Science |
Depositing User: | Unnamed user with email support@apacademicpress.com |
Date Deposited: | 07 Jul 2023 03:54 |
Last Modified: | 07 Jun 2024 10:00 |
URI: | http://info.openarchivespress.com/id/eprint/1732 |